NEWS 5 Power Electronics Europe Issue 2 2025 Power Electronics Europe indium.com HIGH-RELIABILITY ©2025 Indium Corporation Die-Attach Substrate-Attach Top-Side Die Interconnect Package-Attach PCB Assembly Materials for ALL Power Electronics Devices Navitas Semiconductor a pure-play, next-generation power semiconductor company and an industry leader in gallium nitride (GaN) power ICs and silicon carbide (SiC) technology, has announced it has introduced a new level of reliability to meet the system lifetime requirements of the most demanding automotive and industrial applications. Navitas says its latest generation of 650 V and 1200 V ‘trench-assisted planar’ SiC MOSFETs combined with an optimised, HV-T2Pak top-side cooled package, delivers the industry’s highest creepage of 6.45 mm to meet IECcompliance for applications up to 1200V. Navitas’ HV-T2PaK SiC MOSFETs can significantly increase system-level power density and efficiency while improving thermal management and simplifying board-level design and manufacturability. Target applications include EV on-board chargers (OBC) & DC-DC converters, data-centre power supplies, residential solar inverters & energy storage systems (ESS), EV DC fast chargers, and HVAC motor drives. AEC-Q101 is an automotive industry standard developed by the Automotive Electronics Council (AEC) to establish common part-qualification and qualitysystem standards. Navitas says it has created an industry-first benchmark, ‘AEC-Plus’*, indicating parts qualified above and beyond the existing AECQ101 and JEDEC product qualification standards and this new benchmark showcases its deep understanding of system-level lifetime requirements and a strong commitment to enabling rigorously designed and validated products for demanding mission profiles in automotive and industrial applications. *Navitas uses the term ‘AEC-Plus’ to indicate parts exceeding AEC-Q101 standards for reliability testing, published by the Automotive Electronics Council (AEC), based on Navitas test results www.navitassemi.com Navitas redefines reliability
RkJQdWJsaXNoZXIy MjQ0NzM=